This line of CALIBRATION SUBSTRATES allows the user to calibrate any microwave probehead at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected. Each calibration substrate contains highly precise elements for calibrating out the unavoidable errors and losses in a microwave network analyzer, its associated cabling, and the microwave probe to ensure accurate on-wafer testing. | - Supports Precise SOLT, LRL/TRL, and LRM/TRM calibrations
- Includes CalKit software for easy loading to Network Analyzer
- Wide pitch range from 30 to 2,540 microns
- Suitable for all Picoprobes® from DC to 220 GHz
- Available for GS, SG, GSG Footprints
- Convenient alignment structures
- Individually tested and trimmed to exacting standards
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| Accurate, easy to use calibration substrates, calibration coefficients, and detailed instructions allow you to correct the measurement system (network analyzer + cabling + probe) whenever it produces a reading different than the standard. The typical elements for calibrating a microwave measurement system consists of opens, shorts, matched loads, and throughs. These four elements have electrical characteristics that are very different from one another so that each element contributes an important part to the overall calibration process. In principle any set of standards could be employed, however, the more identical the standards are, the less accurate the calibration process becomes, which in turn results in inaccurate on-wafer testing. Precision crafted calibration substrates, when properly used, assure you of accurate on-wafer test results. How to select the correct calibration substrate for your probing application(s): - Identify your probe's footprint and pitch (tip spacing)
- Determine which calibration type is appropriate for your application (SOLT, LRL/TRL, or LRM/TRM)*
- Using the Calibration Substrate Selection Guide, choose the calibration substrate which matches your probe's footprint, recommended pitch range, and your preferred calibration type.
| Calibration Substrate Selection Guide | Calibration
Substrate | Pad Size (microns) | Calibration
Types Supported | Footprint | Pitch Range
Recommeded (µm) | Pitch Range
Acceptable (µm) | PSGCS5 | 50 x 50 | SOLT, LRL, LRM | GSG | 75 - 250 | 75 - 250 | PSGCS9 | 100 x 100 | SOLT, LRL, LRM | GSG | 250 - 600 | 150 - 600 | PSGCS10 | 150 x 150 | SOLT, LRM | GSG | 600 -1250 | 225 -1250 | PSGCS18 | 300 x 300 | SOLT, LRM | | GSG | 1250 - 2540 | 500 - 2540 | Table 1 | PSGCS8 | 50 x 50
100 x 100
150 x 150 | SOLT, LRM | | GS, SG | 50 - 200 | 50 - 300 | PSGCS14 | 50 x 50 | SOLT, LRM | | GS, SG | 200 - 400 | 150 - 600 | PSGCS11 | 50 x 50 | SOLT, LRM | | GS, SG | 400 - 1250 | 175 - 1250 | PSGCS15 | 50 x 50 | SOLT, LRM | | GS, SG | 750 - 2540 | 450 - 2540 | Table 2 | Special Calibration Substrate Designed For Use Above 110 GHz | PSGCS15 | 25 x 25 | SOLT, LRL, LRM | | GSG | 40 - 150 (SOLT)
30 - 150
(LRL) | 40 - 150 | Table 3 | SOLT = Short-Open-Load-Through
LRL = Line-Reflect-Line (Which is equivalent to TRL = Through-Reflect-Line)
LRM = Line-Reflect-Match (Which is equivalent to TRM = Through-Reflect-Match) |
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